International Electronic Machines Corporation develops, manufactures, and markets rugged imaging and sensor-based systems for transportation security, safety and metrology. The Company specializes in integrated systems development incorporating smart sensors for use in maintenance/safety inspection and security and environment monitoring, with applications ranging from custom-designed instruments and sensors to wide area networks delivering timely, appropriate decision support information.Technology Specialization include: Imaging Systems (visible, NIR, IR) NDT/NDE Sensors (Hall effect, eddy current, EMAT, acoustics) Smart Sensor Applications; Rugged Instrumentation Packaging; Sensor Fusion; Digital signal processing and enhancement and Custom PCB design. Multispectral Imaging Systems: Imaging in multiple spectra (infrared, visible, ultraviolet, etc) can be used to detect energy loss, locate flawed or worn components in machines and electronics, and assist in security and safety applications by permitting the detection of people and vehicles even in total darkness. Includes our Infrared/Visible Inspection Camera and the sensor units for the Grade Crossing monitor and others. Transportation NDT/NDE Safety and Maintenance Metrology Systems: Using a multitude of sensors (ranging from laser-based 3d imaging to electromagnetic field-based devices like EMAT and Hall Effect sensors), IEM's systems assist in inspection of transportation equipment for safety and maintenance. These include our portable and rail-based wheel inspection systems and rail flaw detection devices, and brake measurement systems for commercial vehicle inspection. Smart Sensors and Data Analysis Systems: "Smart sensors" are systems which can themselves recognize critical events and situations and take appropriate action -- alerting authorities, issuing warnings, etc. -- without the need for human monitoring. Ever-alert and reliable, these systems include our Grade Crossing Monitor for railroad safety and current systems under development for NASA and others.
