SBIR-STTR Award

Clean Tool: a unified approach to wafer cleaning
Award last edited on: 12/28/2023

Sponsored Program
SBIR
Awarding Agency
NSF
Total Award Amount
$650,000
Award Phase
2
Solicitation Topic Code
NM
Principal Investigator
Hang Ji

Company Information

Uncopiers Inc

910 Poyntz Avenue
Manhattan, KS 66502
   (785) 776-9990
   iz@uncopiers.com
   www.uncopiersinc.com
Location: Single
Congr. District: 01
County: Riley

Phase I

Contract Number: 0945041
Start Date: 1/1/2010    Completed: 6/30/2010
Phase I year
2009
Phase I Amount
$150,000
This Small Business Innovation Research (SBIR) Phase I project, will develop a new kind of wafer cleaning tool that will be useful at every cleaning step in semiconductor processing. It will use an environmentally friendly, acoustic technology that uses only clean water and silent sound. The tool will clean a wafer by simultaneously detecting and dislodging the particulates from the wafer using UPW (ultra pure water) until all particulates have been removed. Its novelty is that this will be the first tool incorporating the endpoint determined cleaning. It will then rinse the wafer briefly and dry it in the same tool. In this streamlined sequence, a fully clean wafer will be available for the next process step much more quickly, much more economically, and in much less cleanroom space. Cleaning mechanism relies on constructively controlled acoustic microcavitation precisely brought about at the particle location to dislodge the particle; the cavitation implosion echo is simultaneously detected and cleaning kept track of. This tool will be applicable to all sub-100nm technology nodes. It will be able to detect on-wafer particulates well below 50nm. The broader impact/commercial potential of this project beyond semiconductor application will be in precision cleaning of lithography masks, mems, solar cells, flat panel displays, HDDs, and precision optics. Ultimately, the principle of constructively controlled microcavitation relies on controlling the very fundamental process of phase change, the control of nucleation -- the ability to convert a liquid into a gas in the vicinity of a solid phase. This should have much wider applications in a variety of chemical processing, e.g. in the control of the boiling processes in chemical and nuclear reactors. The study of this acoustically mediated nucleation control could form an active field/area of research and education. Rejected wafers amount to a colossal waste of prime resources including energy, material, and productivity time; it further amounts to environmental degradation through the effluents and scrap generated. The use of clean tool to prevent such wafer loss directly benefits the society at large

Phase II

Contract Number: 1127460
Start Date: 12/15/2011    Completed: 11/30/2013
Phase II year
2012
Phase II Amount
$500,000
This Small Business Innovation Research (SBIR) Phase II project aims to develop a single wafer processing clean tool for semiconductor wafer cleaning at all stages of wafer processing. The method relies on using acoustically controlled micro-cavitation to remove on-wafer particles. This is a chemical-free cleaning method, using ultra-pure water as the only processing fluid. During cleaning the particles will be counted as they get removed. The cleaning is deemed complete when there remain no more particles to be removed. The wafer will then be rinsed and dried in the same tool. This project is expected to provide a one-at-a-time wafer cleaning method with all the four functionalities of cleaning, inspection, rinsing and drying accomplished in a single setting. The broader/commercial impacts of this project will be the potential to provide a complete environmentally-friendly solution to the wafer cleaning predicament. Cleanliness is a critical requirement in semiconductor manufacturing that directly impact the chip yields. Among all processing steps in semiconductor manufacturing, approximately one in every five processing steps is wafer cleaning. Perfect wafer cleaning is a significant, yet unsolved, problem in semiconductor industry, and the need is becoming more urgent as the technology moves towards sub-50nm design nodes. In this project, a wafer-cleaning tool will be developed to address this market need. This tool will also be useful in precision cleaning needed in the cleaning of lithography masks, Microelectromechanical Systems (MEMS), solar cells, flat panel displays, and hard disk drives (HDDs)