SBIR-STTR Award

Electronic device aging creates substantial problems for government and commercial users of technology. As electronics evolve to be more complex decade-old legacy approaches to electronics aging assessment are no longer adequate. The internal functional state of Integrated Circuits (ICs) and other piece parts are causally related to the Radio Frequency (RF) emission signatures that all electronics naturally emit. Advanced sensors and data processing techniques provide a unique opportunity to make dramatic advances in this field. The Advanced Diagnostics of Electronic Devices (ADEC) ultra-sensitive RF emissions collection system that has been shown to have adequate sensitivity to measure aging effects. ADEC will be used to develop the necessary techniques and methodology to overcome these deficiencies and develop an Aging and Reliability Module (ARM) for the assessment of aging effects in electronic devices.