SBIR-STTR Award

In-space X-ray Analyzer
Award last edited on: 2/26/2024

Sponsored Program
SBIR
Awarding Agency
NASA : LaRC
Total Award Amount
$149,867
Award Phase
1
Solicitation Topic Code
Z4
Principal Investigator
Huapeng Huang

Company Information

Advanced Analyzer Labs Inc

3982 Old Columbia Pike
Ellicott City, MD 21043
   (301) 405-2869
   N/A
   N/A
Location: Single
Congr. District: 07
County: Howard

Phase I

Contract Number: 2023
Start Date: ----    Completed: 7/28/2023
Phase I year
2023
Phase I Amount
$149,867
To meet the NASA’s needs for in-space inspection, Advanced Analyzer Labs, Inc. (AAL) proposes an innovative X-ray analyzer. This analyzer is designed to be portable, compact, low power, safe, light weight, flexible, and highly efficient for conducting the following None-destructive Evaluation (NDE) tests using X-ray Diffraction (XRD), X-ray Fluorescence (XRF), and X-ray imaging. Inspection of additively manufactured parts in space. Detection of commonly known defects in materials. Analysis of regolith/drill core samples The key innovation of this X-ray analyzer is the utilization of a large, intensive collimating X-ray beam, with a diameter of up to 15mm, to facilitate flexible XRD, XRF, and X-ray imaging measurements. The parallel beam geometry of the analyzer enhances the reliability and efficiency of XRD and XRF measurements and improves the flexibility and efficiency of X-ray imaging. The significant innovation of this analyzer is: Highly efficient and reliable from using one compact X-ray source and parallel beam geometry. Simple and flexible configuration to implement multiple NDE X-ray functions. Safe due to the collimating beam is easy to constrain. Portable and flexible for in-situ and in-field tests of AM parts, and other components/samples. The compact size, lightweight, low power consumption, safety, flexibility, and multiple capabilities of the X-ray analyzer make it a highly desirable tool for NASA's in-space inspection needs. Anticipated

Benefits:
NASA is seeking new None-destructive Evaluation (NDE) tools for astronauts to use in a habitat or in the space environment. This proposed analyzer can be used for the following in-space NDE tests for the NASA applications: Inspection of additively manufactured parts in space. Detection of commonly known defects in materials. Analysis of regolith/drill core samples through X-ray Diffraction (XRD), X-ray Fluorescence (XRF), and X-ray imaging. This X-ray analyzer technology with XRD, XRF and X-ray imaging brings a totally new Quality Assurance (QA) and Quality Control (QC) tool for a variety of industrious applications, which include the fast-growing Additive Manufacturing (AM) in the aerospace industry, the automotive industry, consumer products, healthcare, government and defense etc.

Phase II

Contract Number: 80NSSC23PB297
Start Date: 2/2/2024    Completed: 00/00/00
Phase II year
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Phase II Amount
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