SBIR-STTR Award

The proposed innovation is aimed at the Focus Area 10 Advanced Telescope Technologies, subtopic S2.03 Advanced Optical Systems and Fabrication/Testing/Control Technologies for Extended-Ultraviolet/Optical and Infrared Telescope (Scope Title: Fabrication, Test, and Control of Advanced Optical Systems). Hedgefog Research Inc. (HFR) proposes to develop a new Thermal Expansion Mapper (TEM) providing rapid, nondestructive characterization of the coefficient of thermal expansion (CTE) homogeneity in 4-m-class Zerodur and 2-m-class ULE mirror substrates. TEM sensor, employing almost exclusively COTS sub-components, is capable of measuring CTE at multiple locations to sub-ppb/K uncertainty with spatial sampling on a 100×100 grid. In principle, TEM technology has the potential to far exceed the requirement of this solicitation by reaching sub-mm2 spatial resolution and 10 ppt/K uncertainty of CTE (ppt: part per trillion). This new characterization capability will allow selection of mirror substrates before they undergo costly manufacturing process to turn into lightweight space mirrors for NASA’s telescopes. Potential NASA Applications (Limit 1500 characters, approximately 150 words): NASA applications for TEM are mainly focused on fundamental physics research, characterization of large and small optics and, possibly, aerospace components. In essence, TEM provides a simple and ultrasensitive approach to mapping the CTE of various components, small and large in size, by employing a novel sensing scheme while leveraging mature commercial technologies. As the result, HFR’s approach promises a low-cost, versatile solution not just to NASA but all branches of the Government and numerous Government contractors. Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words): Commercial applications of the proposed technology include optics characterization, materials for aerospace, automotive, semiconductor industry (EUV lithography) and, possibly, medical instrumentation industry. All these applications require mapping of the inhomogeneity of CTE. Additionally, TEM technology will find uses in micro-optics. Duration: 6

The proposed innovation is aimed at the Focus Area 10 - Advanced Telescope Technologies, subtopic S2.03 - Advanced Optical Systems and Fabrication/Testing/Control Technologies for Extended-Ultraviolet/Optical and Infrared Telescope (Scope Title: Fabrication, Test, and Control of Advanced Optical Systems). Specifically, NASA needs a reliable, easy-to-use metrology solution that allows highly precise characterization of thermal expansion of large-format glass substrates (e.g. 4-m class Zerodur or 2-m class ULE). To address the NASA need, Hedgefog Research Inc. (HFR) proposes to continue development of its unique Thermal Expansion Mapper (TEM), which provides ultra-precise, rapid, nondestructive characterization of the coefficient of thermal expansion (CTE) homogeneity. HFR’s TEM offers a highly sensitive, stable, and scalable sensor package with low system overhead that allows 1 ppb/K-level CTE characterization over a few days/weeks for large-format glass substrates. In TEM, HFR adopts multiple design features that eliminate various systematic/random error sources in displacement sensing, thereby providing high sensitivity and repeatability in the presence of environmental perturbations (e.g., temperature variation, vibration, presence of dust, etc.). This new characterization capability promises significant savings in time and cost by allowing the selection of mirror substrates before they undergo costly manufacturing process to turn into lightweight space mirrors for NASA’s telescopes. Potential NASA Applications (Limit 1500 characters, approximately 150 words): NASA applications are mainly focused on fundamental physics research, characterization of large and small optics and, possibly, aerospace components. In essence, TEM provides a simple and ultra-sensitive approach to mapping the CTE of various components, by employing a novel sensing scheme while leveraging mature commercial technologies. As the result, it promises a low-cost, versatile metrology solution that can be used in large-format mirror/lens production not just for NASA but many other branches of the Government and military contractors. Potential Non-NASA Applications (Limit 1500 characters, approximately 150 words): Commercial applications of the technology include optics characterization, materials for aerospace, automotive, semiconductor industry (EUV lithography) and, possibly, medical instrumentation industry. All these applications require mapping of the inhomogeneity of CTE. Additionally, TEM technology may find uses in micro-optics. Duration: 24