Continental Optical Corporation proposes to develop a scanning optical profiler for measuring the shape and surface topography of x-ray telescope components, such as those used in the Advanced X-ray Astronomy Facility (AXAF). Based on the principle of the Long Trace Profiler(LTP), this instrument would measure cylindrical x-ray telescope mirrors in the vertical configuration, minimizing errors caused by gravity-induced deflections in the optical surface. The LTP address the need for testing techniques necessary to develop fabrication methods for high angular resolution x-ray optics and for producing low- scatter optical surfaces. The proposed technique would also be applicable to testing in adverse environments, such as in cryogenic testing of optics. This instrument would serve as a cost-effective complementary metrology technique to the present figure metrology used in the fabrication of the AXAF telescope mirrors and would facilitate the manufacture of large mirrors to be used in future x-ray telescope projects. The project objectives are to 1) identify surface figure requirements for current and proposed x-ray telescope projects and determine the required LTP performance specifications, 2) perform a proof-of- concept experiment for the vertical scanning geometry, and 3) develop a conceptual design for a full-scale Phase II prototype instrument. Continental will work with individuals from Brookhaven National Laboratory under the auspices of an existing CRADA to transfer technology into the commercial sector.Useful as a unique metrology instrument in the precision optical fabrication industry and in the rapidly-expanding area of precision machining with single-point diamond tools. Potential applications for remote metrology in adverse environments, such as in cryogenic systems or under ultra high vacuum, as in synchrotron radiation beam lines. It is useful for measuring surface finish properties of steel rollers used in sheet metal
Keywords: Phase_I, NASA, Abstract, FY94
