The overall objectives of this project are to design and develop a novel, high-brightness, compact, and low-cost microspot x-ray source employing a liquid metal ion source, and to design and develop a high-resolution, automated-scanning NDE method for locating, identifying, and measuring surface cracks in the range of 0.001 mm to 5 mm. The results would dramatically advance the applications of x-ray NDE technology and significantly promote scientific research and technical development in many important areas, such as aerospace industry, materials and semiconductor industries, life sciences, and medicine. One important space application is to locate, identify, and measure cracks, defects, and other micro-structures both on the surface and in depth without in roducing any damages to materials. This project can provide very reliable and accurate information useful for predicting the remaining lifetime of materials as well as in-process, non-destructive evaluation and feedback control during the manufacturing of composite materials, fabrics, and metals in space or on ground.This high-resolution, automated scanning NDE method for locating, identifying, and measuring surface cracks will have uses in materials research and processing, semiconductor industries, life sciences, and medicine.NDE, scanning microscope, x-ray, surface cracks STATUS: Phase I Only
