SBIR-STTR Award

Conductor faults can be devastating to a mission; having an embedded fault that is not detectable by current test and quality methods is a latent defect and impairs the integrity of the electrical wiring system. One such fault, Red Plague, is currently only found after damage has occurred (often not located until stored wire is stripped prior to installation or after installed wire is stripped during replacement/repair). This SBIR effort will optimize, validate, and deliver methods to consistently create Red Plague, develop non-destructive test (NDT) methods to test for the presence of Red Plague, and ultimately design and develop an associated testing device that will reliably test wire for Red Plague throughout the wire products lifecycle. (Approved for Public Release 15-MDA-8482 (17 November 15))

DAngelo Technologies, LLC (D5T) successfully conducted research to develop non-destructive test equipment and procedures for detecting Red Plague within an insulated silver plated copper conductor. Red Plague is an embedded fault and the consequences of Red Plague formation compromises the integrity of both the electrical and mechanical properties of the wiring system often resulting in wholesale replacement of wire and harnesses, mission abort, or mission failure. The presence of Red Plague is often not located until stored wire is stripped during installation, repair or replacement. Visual inspection for Red Plague is not consistent and is very subjective, especially if the Red Plague is found at the ends of the wire and the extent of Red Plague within the length of the wire is unknown. This Phase II SBIR presents a path to prototypes of three NDT methods for detecting Red Plague within conductors. Approved for Public Release | 16-MDA-8951 (15 December 16)