The objective of this program is to develop innovative methodologies that will aid in the long term reliability assessment of missile electronics in support of the Missile Defense Agencys Stockpile Reliability Program. AET, Inc. will perform a detailed study of existing electrical, physical and environmental tests that are commonly applied to accelerated aging and reliability prediction. New electrical, physical and environmental tests that may be used to determine reliability will also be proposed. These tests will be based on the possible physical changes that could happen to an integrated circuit over its lifecycle. As part of the environmental testing, AET will investigate radiation testing. The development of innovative systematic methodologies will be coupled with advanced techniques to assess the long term reliability of missile electronics. Proven methodologies for age acceleration testing of typical missile electronics such as in-situ sensors, health monitoring, and prognostic monitoring will be coupled with advanced reliability assessment techniques such as radiation testing to develop a cost effective approach to predicting missile electronics reliability and shelf life estimates.
Keywords: Accelerated Aging, Stockpile Reliability, Microelectronics, In-Situ Sensor, Reliability Prediction, Health Monitoring, Built-In-Test, Radiation Testing
