SBIR-STTR Award

Development of Pulse/DC Characterization System for LEDs
Award last edited on: 6/13/2022

Sponsored Program
SBIR
Awarding Agency
DOC : NIST
Total Award Amount
$353,128
Award Phase
2
Solicitation Topic Code
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Principal Investigator
Paul Corr

Company Information

Arroyo Instruments LLC

624 Clarion Court
San Luis Obispo, CA 93401
   (805) 481-6684
   sales@arroyoinstruments.com
   www.arroyoinstruments.com
Location: Single
Congr. District: 24
County: San Luis Obispo

Phase I

Contract Number: ----------
Start Date: ----    Completed: ----
Phase I year
2009
Phase I Amount
$82,390
The purpose of this project is to implement the process for a new method for the measurement of LED performance, but in a form that is low-cost, integrated, and easy-to-use, so that the barrier to entry is as low as is possible. COMMERCIAL APPLICATIONS: The commercial potential of the application is significant, as it could ultimately reach into every LED R&D, test, and manufacturing facility. Arroyo Instruments would develop a kit which includes all the components necessary

Phase II

Contract Number: ----------
Start Date: ----    Completed: ----
Phase II year
2010
Phase II Amount
$270,738
Development of LEDs for various applications, such a vehicle lighting, signage, and commercial and residential solid state lighting is progressing at a rapid pace. Various methods exist for measuring the performance of LEDs, but variations in test configurations, thermal management, T&M equipment, and operator experience lead to significant variation in measured performance. The project will design a commercially viable instrument for precisely controlling LED junction temperatures for consistent and repeatable performance during LED test processes. The method, as defined by the Zong/Ohno, eliminates the variations and repeatability errors in thermal interfaces and ensures the junction temperature, a key metric in LED testing, is both known and controllable. Both DC and AC testing modes will be supported. Commercial Applications: This process will create a common, comparable standard for device characterization. However, the market does not presently offer an integrated solution, instead forcing customers to piece together a system with individual pieces, and then develop the process to control them. This presents a huge cost to the user and creates a significant barrier for entry, which will hinder the acceptance of the process as a standard. The commercial potential of the application is significant, as it could ultimately reach into every LED R&D, test, and manufacturing facility. Because it eliminates variations in LED temperature, which is a critical metric in LED performance, this method has the potential to significantly change the way LED specifications are developed. A peer-reviewed, integrated system will significantly speed the adoption of this test method