The project objective is to build a prototype of a higher throughput moving probe tester based on the designs discussed in our Phase I proposal. This higher throughput system will utilize a novel configuration of multiple probes, together with improved algorithms for testing MCMs and other new types of dense complex substrates on a reliable and cost effective basis. These enhancements together with our patented capacitance/resistance test method and our patented probe design will provide the foundation for this new system. It will be designed to test very small features even on multilevel surfaces without damaging the substrate. The system we are proposing will enable us to increase the probing from 5 pt/sec to 40 pt/sec. The planned design will be based on our proven technology, and thus will have a higher probability of success than if it were a completely new concept. After debugging the prototype in house, we will beta site test the system at the facility of an MCM manufacturer. We believe that we are uniquely qualified to meet this challenge, having introduced moving probe testers in 1983, and having since kept pace with industry needs. Our innovations have been licensed to three of the largest electronics companies in the U.S.
Keywords: BARE CIRCUIT LEVEL; FIXTURELESS; LINEAR MOTOR; MOVING PROBES
