NexGenSemi will develop a unique semiconductor fabrication process to execute multiple AT techniques on a single wafer. During the phase I program, NexGenSemi will perform preliminary sub 90nm tests leading to the TAPO ASIC test structures to be fully executed in the phase II.
Benefit: Provide the DOD a high speed, low cost Trusted AT manufacturing method for electronics below the 90nm node.
Keywords: Anti-Tamper, At, Penetration, Countermeasures, Intellectual Property Protection, Smart Cards, Trusted Foundry Program Office, On-Shore