Company Registry

Nanoelectronic Imaging Inc
Profile last edited on: 7/17/2021

Techniques for mapping signals in transmission electron microscope (TEM): usually inaccessible
Year Founded
2017
First SBIR Year
2020
Latest SBIR Award
2020
Program Status
Active

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Location Information

1518 South Centinela Avenue
Los Angeles, CA 90025
   (617) 347-6436
   N/A
   www.nanoelectronicimaging.com
Multiple Locations:   
Congressional District:   37
County:   Los Angeles

Public Profile

The imaging techniques developed by NanoElectronic Imaging, Inc's (NEI) reveal what are otherwise invisible electronic and thermal structure in micro- and nano-electronic devices. Transmission electron microscope (TEM) is used in the semiconductor industry for quality control of the ten billions of components across millions of products. However, TEM can only see physical structures – effectively the system is blind to the electronic and thermal structures that govern device operation. The Scanning TEM Electron Beam-Induced Current (STEM EBIC) imaging system developed by NEI can quantitatively map temperature, conductivity, potential, electric field, and work function. There exist few alternatives able to map any of these properties at high resolution, and none have the capcity to map them all. Standard TEM imaging identifies only the location of the atoms in an electronic device while NEI’s technology shows what they are doing.

Extent of SBIR involvement

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Synopsis: Awardee Business Condition

Employee Range
1-4
Revenue Range
Less than .5M
VC funded?
No
Public/Private
Privately Held
Stock Info
---
IP Holdings
N/A

Awards Distribution by Agency

Most Recent SBIR Projects

Year Phase Agency Total Amount Project Title
2021 2 DOC $499,992
High-Precision TEM Topography Mapping
2020 1 DMEA $167,455
A High-Resolution TEM Thermometry System

Key People / Management

  William A Hubbard -- CEO

  B C Regan --

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