Company Registry

J A Woollam Company
Profile last edited on: 9/19/2017

Spectroscopic ellipsometry
Year Founded
1987
First SBIR Year
1987
Latest SBIR Award
2009
Program Status
Inactive

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Location Information

645 M Street Suite 102
Lincoln, NE 68508
   (402) 477-7501
   sales@jawoollam.com
   www.jawoollam.com
Multiple Locations:   
Congressional District:   01
County:   Lancaster

Public Profile

J A Woollam began as a spin-off out of the University of Nebraska and has retained strong and close ties to that institution. The firm focuses to spectroscopic ellipsometry with particular expertise in use of that capability in thin film characterization. J.A. Woollam Co. Inc. manufactures spectroscopic ellipsometers for non-destructive thin film and bulk material characterization. Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more. The firms offers ellipsometers covering a spectral range to meet any need (from the vacuum UV to the far IR). The ellipsometers come with many upgrade options: automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells, etc.

Extent of SBIR involvement

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Synopsis: Awardee Business Condition

Employee Range
25-49
Revenue Range
2.5M-5M
VC funded?
No
Public/Private
Privately Held
Stock Info
---
IP Holdings
25-49

Awards Distribution by Agency

Key People / Management

  John A Woollam -- President

  David Doerr --

  Andrea Donohue --

  Craig M Herzinger --

  James Hilfiker --

  Nina Hong --

  David Hoylman --

  Blaine Johs --

  Marge Knight --

  Andrew Martin --

  Duane E Meyer --