SBIR-STTR Award

Low cost, scalable and selective electrochemical metallization process technology
Award last edited on: 6/26/2015

Sponsored Program
SBIR
Awarding Agency
NSF
Total Award Amount
$1,521,846
Award Phase
2
Solicitation Topic Code
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Principal Investigator
Val Dubin

Company Information

NANO3D Systems LLC

22115 NW Imbrie Drive Unit 109
Hillsboro, OR 97124
   (503) 927-4766
   info@nano3dsystems.com
   www.nano3dsystems.com
Location: Single
Congr. District: 01
County: Washington

Phase I

Contract Number: 1315056
Start Date: 7/1/2013    Completed: 12/31/2013
Phase I year
2013
Phase I Amount
$179,999
This Small Business Innovation Research Phase I project advances a novel method to fabricate 3D IC interconnects. Physical and economical limitations for 2D scaling (Moore's Law) prevents further increase of integration density to improve the performance of integrated circuits (IC). These challenges have stimulated the development of 3D through-silicon via (TSV) technology (so called 'More than Moore') in order to increase the speed and the bandwidth of the devices as well as to decrease the form factor and power consumption of integrated microsystems. However, the implementation of 3D TSV technology is limited by the high cost of 3D TSV fill (due to the use of expensive vapor deposition and chemical-mechanical processes) and its poor scalability (due to low conformality of physical and chemical vapor deposited films) to high TSV aspect ratios and smaller via sizes (to increase I/O). The objective of this investigation is to address this problem in order to enable cost-effective and reliable fill of high aspect ratio 3D TSVs. This goal will be achieved with the use of novel electrochemical materials and processes enabling conformal anodic isolation and electroless barrier/seed films, as well as selective electrochemical Cu TSV filling.

The broader impact/commercial potential of this project will be to accelerate the mass-scale adoption of low cost and scalable TSV technology in semiconductor manufacturing. The development of 3D TSV packaging is carried out by various companies in USA, Europe, Japan, Korea, Taiwan, etc. However, the high cost and low scalability 3D TSV filling process prevents mass-adoption of 3D IC interconnects. Our proprietary low-cost, scalable and selective (electrochemical TSV fill technology will allow us to decrease the cost of TSV fill technology by a factor of > 2 and to increase the scalability by a factor of > 3 to fabricate low cost, high speed, large bandwidth and broader functionality 3D devices. Therefore, the successful completion of this project would not only have a significant societal impact by accelerating 3D IC wafer technology adoption into state-of-art high performance digital devices such as next generation of smart phones, but also have positive economic impact by creating US semiconductor jobs and maintaining US technology leadership over a wide range of semiconductor applications.

Phase II

Contract Number: 1456385
Start Date: 3/1/2015    Completed: 2/28/2017
Phase II year
2015
(last award dollars: 2018)
Phase II Amount
$1,341,847

The broader impact/commercial potential of this Small Business Innovation Research (SBIR) Phase II project will be to accelerate the mass-scale adoption of 3D integrated circuits (IC) by decreasing the cost and increasing the scalability of 3D through-silicon vias (TSV) interconnects with electrochemical, low cost and selective metallization technology. After its qualification, 3D TSV selective metallization technology will enable fabrication of high performance 3D microsystems at lower cost by replacing costly damascene interconnect technology with selective electrochemical metallization technology for TSV metal fill, bump and redistribution layer formation. The successful completion of this project would have a significant societal impact by accelerating 3D IC wafer technology adoption into state-of-art high performance digital devices such as next generation of smart phones. This project will also have positive economic impact by creating US semiconductor jobs and maintaining US technology leadership over a wide range of electronic applications and consumer electronic devices. This Small Business Innovation Research (SBIR) Phase II project advances a novel three-dimensional through-silicon vias (TSV) selective metallization technology to fabricate low cost and scalable 3D integrated circuits (IC). Physical and economical limitations for two-dimensional scaling (so called "Moore?s Law") prevent further increase of integration density to improve the performance of IC. These challenges have stimulated the development of 3D TSV technology (so called "More than Moore") in order to increase the speed and bandwidth of the devices as well as to decrease the form factor and power consumption of integrated microsystems. However, the mass adoption of 3D IC is limited by the high cost of 3D TSV interconnects (due to the use of expensive vapor deposition and chemical-mechanical damascene processes) and its poor scalability (due to low conformality of physical and chemical vapor deposited films) to high aspect ratios and smaller via sizes. Proprietary and patented 3D TSV selective metallization technology developed during Phase I project will be further optimized and qualified on production tools to address cost and scalability issues of 3D TSV interconnects. Enabling low cost and scalable 3D ICs will allow heterogeneous systems integration for next generation smart phones and other consumer electronic devices.