SBIR-STTR Award

3D Printed Microscale Radiation Shielding
Award last edited on: 8/5/2019

Sponsored Program
SBIR
Awarding Agency
DOD : MDA
Total Award Amount
$1,160,000
Award Phase
2
Solicitation Topic Code
MDA17-012
Principal Investigator
David J Strobel

Company Information

Space Micro Inc

15378 Avenue Of Science Suite 200
San Diego, CA 92128
   (858) 332-0700
   info@spacemicro.com
   www.spacemicro.com
Location: Multiple
Congr. District: 51
County: San Diego

Phase I

Contract Number: HQ0147-18-C-7240
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
2018
Phase I Amount
$150,000
State-of-the-art COTS microelectronics are often found to be susceptible to radiation and systems are required to be redesigned with a new electronic piece-part or multiple kilogram metal shielding.These modifications increase weight, size, costs, and schedule to the program. Space Micro will design radiation shields based on our modeling/simulation tools and thenleverage existing commercially available additive manufacturing processes and materials that prints shields of graded atomic number (Z) materials for use as a radiation shield around packaged COTS microelectronic parts.We will demonstrate by analysisa reduction in the components susceptibility to radiation induced failure, such as single-event upsets from protons and X-ray dose-rate upset/ survival.Approved for Public Release | 17-MDA-9395(24 Oct 17)

Phase II

Contract Number: HQ0147-19-C-7139
Start Date: 00/00/00    Completed: 00/00/00
Phase II year
2019
Phase II Amount
$1,010,000
State-of-the-art COTS microelectronics are often found to be susceptible to radiation and systems are required to be redesigned with a new electronic piece-part or multiple kilogram metal shielding.These modifications increase weight, size, costs, and schedule to the program. Space Micro will design 3D printed radiation shields based on our modeling/simulation tools and then leverage existing commercially available additive manufacturing processes and materials that prints shields of graded atomic number (Z) materials for use as a radiation shield around packaged COTS microelectronic parts.We will demonstrate, by analysis and radiation testing, a reduction in the components susceptibility to radiation induced failure, such as single-event upsets from protons and X-ray dose-rate upset/ survival.Approved for Public Release | 19-MDA-9932 (21 Feb 19)