SBIR-STTR Award

Advanced Solutions for Radiation Susceptibility Analysis & Prediction
Award last edited on: 8/3/2018

Sponsored Program
SBIR
Awarding Agency
DOD : DTRA
Total Award Amount
$1,148,907
Award Phase
2
Solicitation Topic Code
DTRA162-006
Principal Investigator
Michel Sika

Company Information

Lucid Circuit Inc

112 Montana Avenue Suite 253
Santa Monica, CA 90403
   (213) 326-7053
   contact@lucidcircuit.com
   www.lucidcircuit.com
Location: Single
Congr. District: 33
County: Los Angeles

Phase I

Contract Number: HDTRA1-17-P-0017
Start Date: 00/00/00    Completed: 00/00/00
Phase I year
2017
Phase I Amount
$149,900
With the advent of high-density low-power sub-20nm technology processes and circuits with tens-of-billions of transistors, radiation-induced single-event effects present a new set of design challenges for terrestrial applications. Developing reliable single-event effect resilient microelectronics in these modern technology nodes is a resource and time-intensive endeavor that further requires validation after fabrication. There are significant risks and costs involved in efficiently balancing radiation effects resiliency without losing performance benefits of the new technology nodes. Current analysis tools are not suited to performing the necessary single-event effect resiliency assessment on a scale appropriate for typical modern and future design sizes. With an approach involving current tools, computational requirements are intractable for anything larger than a very small design. Lucid Circuit is developing solutions for designs of all sizes in the form of a Radiation Susceptibility Analysis & Prediction platform or RSAPTM (patent pending). Our approach will help designers implement radiation effects resilient and technology optimized microelectronics in a cost effective manner with limited impact on schedules.

Phase II

Contract Number: HDTRA119C0021
Start Date: 00/00/00    Completed: 00/00/00
Phase II year
2019
Phase II Amount
$999,007
With the advent of high-density low-power sub-20nm technology processes and circuits with tens-of-billions of transistors, radiation-induced single-event effects present a new set of design challenges for terrestrial applications. Developing reliable single-event effect resilient microelectronics in these modern technology nodes is a resource and time-intensive endeavor that further requires validation after fabrication. There are significant risks and costs involved in efficiently balancing radiation effects resiliency without losing performance benefits of the new technology nodes. Current analysis tools are not suited to performing the necessary single-event effect resiliency assessment on a scale appropriate for typical modern and future design sizes. With an approach involving current tools, computational requirements are intractable for anything larger than a very small design. Lucid Circuit is developing solutions for designs of all sizes in the form of a Radiation Susceptibility Analysis & Prediction platform or RSAPTM (patent pending). Our approach will help designers implement radiation effects resilient and technology optimized microelectronics in a cost effective manner with limited impact on schedules.