SBIR-STTR Award

Minority Carrier Lifetime Measurements in Strained Layer Superlattices
Award last edited on: 4/13/2010

Sponsored Program
STTR
Awarding Agency
DOD : Army
Total Award Amount
$99,979
Award Phase
1
Solicitation Topic Code
A09A-T005
Principal Investigator
Daniel Johnstone

Company Information

Amethyst Research Inc (AKA: Amethyst Research Incorporated)

123E Case Street
Ardmore, OK 73401
   (580) 657-2575
   info@amethystresearch.com
   www.amethystresearch.com

Research Institution

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Phase I

Contract Number: ----------
Start Date: ----    Completed: ----
Phase I year
2009
Phase I Amount
$99,979
Type II strained layer superlattice (SLS) p-n diode arrays fabricated on domestic-source GaSb substrates are a promising route to meet the critical need within DoD for large area, large format array infrared detectors. However, current SLS material quality is limiting detector performance. A quantitative, cost effective and trusted evaluation technique for measuring the SLS minority carrier lifetime is critical to establishing a comprehensive development program for the SLS system. In Phase I we will develop an automated, variable temperature photoconductance decay (PCD) lifetime measurement system capable of measuring lifetimes in the range of 1 ns (existing SLS materials quality) up to 25 ms (anticipated long-term SLS quality). The system will also permit synergistic use of equipment components to allow various other techniques to be incorporated on a common platform, such as current transient spectroscopy and photo induced current transient spectroscopy. The appropriate combination with PCD lifetime measurements will provide an unprecedented, coordinated technique for materials evaluation. The program brings together teams from Amethyst Research, Texas State University and IntelliEPI. In Phase II a system will be built and fully evaluated to establish a sustainable product platform. The final product will comprise an Integrated Narrow-Bandgap Lifetime Assessment Platform (INLAP).

Keywords:
Narrow Bandgap, Infrared, Materials, Carrier Lifetime, Metrology, Strained Layer Superlattice, Infrared, Defect

Phase II

Contract Number: ----------
Start Date: ----    Completed: ----
Phase II year
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Phase II Amount
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